Wiesinger, Helene; Wang, Zhanyun; Hellweg, Stefanie
Swiss Federal Institute of Technology in Zurich, Zurich, Switzerland

Le Blévennec, Kévin (1); Müller, Susanne (2)
1: VITO NV, Mol, Belgium; 2: Heliatek GmbH, Dresden, Germany

Schreiber, Stephanie; Hoffmann, Michael; May, Christian
Fraunhofer FEP, Dresden, Germany

Abbel, Robert (1); Chen, Yi (1); Hendriks, Rob (3); Leveneur, Jérôme (2); Parker, Kate (1)
1: New Zealand Forest Research Institute (Scion), Rotorua, New Zealand; 2: GNS Science - Institute of Geological & Nuclear Sciences, Lower Hutt, New Zealand; 3: TNO/Holst Centre, Eindhoven, The Netherlands

Hakola, Liisa; Välimäki, Marja; Immonen, Kirsi; Sokka, Laura
VTT Technical Research Centre of Finland Ltd., Espoo, Finland

Hayashi, Hidetaka
NPO EcoDesign Promotion Network, Tokyo, Japan

Schischke, Karsten (1); Billaud, Mathilde (1); Reinhold, Julia (1); Nissen, Nils (1); Schneider-Ramelow, Martin (1,2)
1: Fraunhofer IZM, Berlin, Germany; 2: Technical University of Berlin, Berlin, Germany

Murayama, Kei
Shinko Electric Industries Co. Ltd., Nagano, Japan

Nissen, Nils F. (1); Clemm, Christian (1); Billaud, Mathilde (1); Töpper, Michael (1); Stobbe, Lutz (1); Schneider-Ramelow, Martin (1,2)
1: Fraunhofer IZM, Berlin, Germany; 2: Technical University of Berlin, Berlin, Germany

Malmodin, Jens
Ericsson, Stockholm, Sweden

Grobe, Klaus; Jansen, Sander
ADVA Optical Networking SE, Munich, Germany

Nguyen, Bichlien H (1); Sinistore, Julie (2); Smith, Jake A. (1); Arshi, Praneet S. (2); Johnson, Lauren M. (2); Kidman, Tim (2); DiCaprio, T.J. (1); Carmean, Douglas (1); Strauss, Karin (1)
1: Microsoft, Redmond, USA; 2: WSP USA Inc., USA

Zhang, Xiaoxi (1); Shinozuka, Machiko (1); Tanaka, Yuriko (1); Kanamori, Yuko (2); MASUI, Toshihiko (2)
1: Nippon Telegraph and Telephone Corporation, Tokyo, Japan; 2: National Institute for Environmental Studies, Ibaraki, Japan

Revellio, Ferdinand (1); Shi, Lin (2); Hansen, Erik G. (1); Chertow, Marian (3)
1: Johannes Kepler University Linz, Linz, Austria; 2: Stanford University, Stanford, USA; 3: Yale University, New Haven, USA

Proske, Marina (1,2); Clemm, Christian (1); Sánchez Fernández, David (1); Ballester Salvà, Miquel (3); Jügel, Marvin (1); Kukuk-Schmid, Heike (1); Nissen, Nils F. (1); Schneider-Ramelow, Martin (1,2)
1: Fraunhofer IZM, Berlin, Germany; 2: Technical University of Berlin, Berlin, Germany; 3: Fairphone, Amsterdam, The Netherlands

Proske, Marina (1,2); Poppe, Erik (1); Jaeger-Erben, Melanie (1,2)
1: Technical University of Berlin, Berlin, Germany; 2: Fraunhofer IZM, Berlin, Germany

Chun, Yoon-Young (1); Matsumoto, Mitsutaka (2); Tahara, Kiyotaka (1)
1: Research Institute of Science for Safety and Sustainability, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan; 2: Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan

Fitzpatrick, Colin (1); Makov, Tamar (2)
1: University Of Limerick, Limerick, Ireland; 2: Ben Gurion University of the Negev, Beersheba, Israel

Pamminger, Rainer; Glaser, Sebastian; Wimmer, Wolfgang; Schmidt, Stephan
Vienna University of Technology, Vienna, Austria

Jattke, Marleen (1); Bieser, Jan (2); Blumer, Yann (3); Itten, René (1); Stucki, Matthias (1)
1: Zurich University of Applied Sciences, Institute of Natural Resource Sciences, Wädenswil, Switzerland; 2: University of Zurich, Department of Informatics, Zurich, Switzerland; 3: Zurich University of Applied Sciences, Institute of Innovation and Entrepreneurship, Winterthur, Switzerland

Clemm, Christian (1); Berwald, Anton (1); Prewitz, Carolin (1); Nissen, Nils F. (1); Schneider-Ramelow, Martin (1,2)
1: Fraunhofer IZM, Berlin, Germany; 2: Technical University of Berlin, Berlin, Germany

Winzer, Janis (1); Czichowski, Johanna (1); Lascho, Tobias (1); Bill, Stine (2); Hipp, Tamina (2); Wagner, Eduard (2); Jaeger-Erben, Melanie (1,2)
1: Fraunhofer IZM, Berlin, Germany; 2: Technical University of Berlin, Berlin, Germany

Sinistore, Julie (1); Shemfe, Mobi (2); Epsom, Robbie (2); Bailey, George (2)
1: WSP USA Inc., Portland, USA; 2: WSP UK, London, United Kingdom

Jarmer, Jan-Philipp; Hohaus, Christian; Gronau, Pauline
Fraunhofer IML, Dortmund, Germany

Kawaguchi, Taro; Murata, Hidenori; Fukushige, Shinichi; Kobayashi, Hideki
Osaka University, Osaka, Japan

Riess, Michael
VDE Institute for Testing and Certification GmbH, Offenbach am Main, Germany

Bressanelli, Gianmarco; Baccanelli, Irene; Saccani, Nicola; Perona, Marco
University of Brescia, Brescia, Italy

Steux, Chloé (1,2); Aggeri, Franck (1,2)
1: Mines ParisTech, Paris, France; 2: Chaire Mines Urbaines, Fondation ParisTech, ecosystem, Paris, France

Wagner, Eduard (1); Poppe, Erik (1); Hahn, Florian (1); Jaeger-Erben, Melanie (2); Druschke, Jan (2); Nissen, Nils F. (2); Lang, Klaus-Dieter (1,2)
1: Technical University of Berlin, Berlin, Germany; 2: Fraunhofe IZM, Berlin, Germany

Navarro-Segarra, Marina (1); Sabaté, Neus (1,2); Esquivel, Juan Pablo (1)
1: Institute of Microelectronics of Barcelona, IMB-CNM (CSIC), Barcelona, Spain; 2: Catalan Institution for Research and Advanced Studies (ICREA), Barcelona, Spain

Andrae, Anders S.G.
Huawei Technologies Sweden AB, Stockholm, Sweden

Savi, Daniel (1); Widmer, Rolf (2); Kasser, Ueli (1)
1: Büro für Umweltchemie GmbH, Zurich, Switzerland; 2: Empa, Technology and Society Department, St. Gallen, Switzerland

Grieger, Sven (1); Bokelmann, Katrin (1); Benner, Wladislaw (1); Schlummer, Martin (2); Vogelgesang, Malte (3)
1: Fraunhofer IWKS, Alzenau, Germany; 2: Fraunhofer IVV, Freising, Germany; 3: Technical University of Darmstadt, Darmstadt, Germany

Arnaiz, Sixto (1); Cacho, Iñigo (1); Uria, Iratxe (1); Guarde, Dorleta (2); Arieta-araunabeña, Maider (2); Stergiou, Athanasios (3); Karamoutsos, Spyridon-Dionysios (3); Antunes, Ana-Catarina (4); Oliveira, Elisabete (4); Sillaurren, Sara (5); Bastida, Leire (5)
1: GAIKER Technology Centre, Zamudio, Spain; 2: INDUMETAL RECYCLING, S.A., Asua-Erandio, Spain; 3: BIANATT, S.A., Aspropirgos, Greece; 4: INTERECYCLING, S.A., Tondela, Portugal; 5: TECNALIA, Derio, Spain

Poudelet, Louison; Calvo Duarte, Laura; Cardona Coma, Roger; Lustig, Pamela
Fundació Privada Centre CIM, Barcelona, Spain

Kitazume, Christian
Umweltbundesamt, Dessau-Roßlau, Germany

Dimitrova, G. (1); Feenstra, T. (2); Berwald, A. (1); Nissen, N.F. (1); Höggerl, G. (3); Schneider-Ramelow, M. (1,4)
1: Fraunhofer IZM, Berlin, Germany; 2: Pezy Group Groningen, Groningen, Netherlands; 3: MGG Polymers, Kematen an der Ybbs, Austria; 4: Technical University of Berlin, Berlin, Germany

Maisel, Franziska (1); Emmerich, Johanna (1); Dimitrova, Gergana (2); Berwald, Anton (2); Nissen, Nils F. (2); Schneider-Ramelow, Martin (1,2)
1: Technical University of Berlin, Berlin, Germany; 2: Fraunhofer Institute for Reliability and Microintegration IZM, Berlin, Germany

Boudewijn, Alexander Theodorus Petrus; Peeters, Jef R; Duflou, Joost R.
Catholic University of Leuven, Leuven, Belgium

Holmes, Corinne
Microsoft, Seattle, United States of America

Wagner, Florian (1,2); Bracquene, Ellen (1); Wagner, Eduard (3); De Keyzer, Jozefien (2); Duflou, Joost R. (1); Dewulf, Wim (1); Peeters, Jef (1)
1: Department of Mechanical Engineering, KU Leuven, Leuven, Belgium; 2: Department of Chemical Engineering, KU Leuven, Diepenbeek, Belgium; 3: Technical University of Berlin, Berlin, Germany

Otto, Sarah Julie; Korf, Nathalie; Mählitz, Paul Martin; Rotter, Vera Susanne
Technical University of Berlin, Berlin, Germany

Campadello, Luca (1); Legnani, Gaia (1); Vincenti, Nazarena (1); Muhammad, Qureshi Saad (2); Schlummer, Martin (3); Quiros, Sandra Ramon (4); Rodriguez, Juan Miguel Moreno (5); Fermoso, Javier (5); Barreto, Carlos (6); Taveau, Mathilde (7); Ardolino, Filomena (8); Cardamone, Giovanni Francesco (8); Arena, Umberto (8)
1: ECODOM, Lainate, Italy; 2: VTT Technical Research Centre of Finland, Espoo, Finland; 3: Fraunhofer IVV, Dresden, Germany; 4: Aimplas - Plastics Technology Centre, Valencia, Spain; 5: IMDEA Energy, Madrid, Spain; 6: Norner Research AS, Telemark, Norway; 7: Coolrec B.V, Dordrecht, The Netherlands; 8: The University of Campania Luigi Vanvitelli, Caserta, Italy

Oguchi, Masahiro (1); Terazono, Atsushi (1); Kajiwara, Natsuko (1); Murakami, Shinsuke (2)
1: National Institute for Environmental Studies, Ibaraki, Japan; 2: The University of Tokyo, Tokyo, Japan

Cuénot, Laurène; Carteron, Edouard; Assimon, Pierre-Marie
ecosystem, Paris, France

Jakowczyk, Marta
HP Inc., Barcelona, Spain

Slijkhuis, Chris
EERA, Amsterdam, The Netherlands

Cuénot, Laurène; Carteron, Edouard; Assimon, Pierre-Marie
ecosystem, Paris, France

Onozuka, Sota; Kishita, Yusuke; Umeda, Yasushi
The University of Tokyo, School of Engineering, Tokyo, Japan

Terazono, Atsushi; Oguchi, Masahiro
National Institute for Environmental Studies, Ibaraki, Japan

Cotovia Pimentel, Marcos Batista; Ramirez Quintero, Deyber Alexander; Bezana, Thiago Berti
CTI Renato Archer, Campinas, Brazil

McMahon, Kathleen; Fitzpatrick, Colin
University of Limerick, Limerick, Ireland

Pietrzela, Mateusz
Leipzig University, Leipzig, Germany

McMahon, Kathleen; Fitzpatrick, Colin
University of Limerick, Limerick, Ireland

Khetriwal, Deepali Sinha (1,3); Wehrli, Andrea (1,2); Gasser, Michael (1,2)
1: E[co]work International, St. Gallen, Switzerland; 2: EMPA, Dübendorf, Switzerland; 3: Sofies, Bangalore, India

Dao, Tung; Cooper, Tim; Watkins, Matthew
Nottingham Trent University, Nottingham, United Kingdom

Wiens, Kyle
iFixit, Troy, USA

Johnson, Michael; Fitzpatrick, Colin
University of Limerick, Limerick, Ireland

Svensson-Hoglund, Sahra (1); Russell, Jennifer Dianne (1); Luth Richter, Jessika (2); Dalhammar, Carl (2)
1: Virginia Tech University, Blacksburg, USA; 2: Lund University, International Institute for Industrial Environmental Economics, Lund, Sweden

Groscurth, Balthasar (1); Jaeger-Erben, Melanie (2); Deubzer, Otmar (2); Batteiger, Alexander (3)
1: Technical University of Berlin, Berlin, Germany; 2: Fraunhofer IZM, Berlin, Germany; 3: Deutsche Gesellschaft für internationale Zusammenarbeit, Frankfurt, Germany

Legler, Solveig (1); Benecke, Stephan (2)
1: 1cc GmbH / TechProtect GmbH, Holzgerlingen, Germany; 2: 1cc Corp., Washington D.C., USA

Calvin, Susannah
Apple, Cupertino, USA

Rudolf, Sina (1); Scheller, Christian (1); Sharma, Priyanka (2); Lawrenz, Sebastian (2); Blömeke, Steffen (1); Mennenga, Mark (1); Schmidt, Kerstin (1); Herrmann, Christoph (1); Spengler, Thomas S. (1); Rausch, Andreas (2)
1: Technical University of Braunschweig, Braunschweig, Germany; 2: Clausthal University of Technology, Clausthal-Zellerfeld, Germany

Kimita, Koji (1); Matschewsky, Johannes (2); Sakao, Tomohiko (2)
1: Tokyo Metropolitan University. Tokyo, Japan; 2: Linköping University, Linköping, Sweden

Daus, Sebastian
FixFirst, Berlin, Germany

Kopka, Jan-Philip (1); Hesse, Kathrin (2); Fetting, Thomas (3); Preut, Anna (1); Hohaus, Christian (1); Wissing, Matthias (2)
1: Fraunhofer Institute for Material Flow and Logistics IML, Dortmund, Germany; 2: Technical University of Cologne, Cologne, Germany; 3: WILO SE, Dortmund, Germany

Wagner, Stefan (1); Wüst, Felix (1); Sehr, Frederic (1); Dobs, Tom (2); Schneider-Ramelow, Martin (2)
1: Fraunhofer IZM, Berlin, Germany; 2: Technical University of Berlin, Berlin, Germany

Sterkens, Wouter; Diaz-Romero, Dillam; Goedemé, Toon; Dewulf, Wim; Peeters, Jef
Catholic University of Leuven, Leuven, Belgium

Jacob, Peter
Empa Swiss Federal Laboratories for Materials Testing and Research, Dübendorf, Switzerland

Hahn, Daniel; Sehr, Frederic; Straube, Stefan; Dobs, Tom; Berwald, Anton; Wittler, Olaf; Schneider-Ramelow, Martin
Fraunhofer IZM, Berlin, Germany

Dobs, Tom (1); Sánchez, David (1); Schischke, Karsten (1); Wittler, Olaf (1); Schneider-Ramelow, Martin (2)
1: Fraunhofer IZM, Berlin, Germany; 2: Technical University of Berlin, Berlin, Germany

Suppipat, Suphichaya; Hu, Allen H.
National Taipei University of Technology, Taipei City, Taiwan

Grobe, Klaus; Jansen, Sander
ADVA Optical Networking SE, Munich, Germany

Miyake, Gaku (1); Matsuda, Genichiro (1); Tajima, Akio (2); Matsumoto, Mitsutaka (3); Tahara, Kiyotake (3)
1: Panasonic Corporation, Osaka, Japan; 2: Panasonic Environmental Technology Solutions Co., Ltd., Osaka, Japan; 3: National Institute of Advanced Industrial Science and Technology, Ibaraki, Japan

Hamano, Masafumi (1); Arekrans, Johan (2); Ölundh Sandström, Gunilla (2)
1: The University of Tokyo, Tokyo, Japan; 2: KTH Royal Institute of Technology, Stockholm, Sweden

Poppelaars, Flora (1,2); Bakker, Conny (1); van Engelen, Jo (1,3)
1: Delft University of Technology, Delft, The Netherlands; 2: Partners for Innovation, Amsterdam, The Netherlands; 3: University of Groningen, Groningen, The Netherlands

Nishijima, Daisuke (1); Oguchi, Masahiro (2)
1: Fukushima University, Fukushima, Japan; 2: National Institute for Environmental Studies, Ibaraki, Japan

Ishibashi, Kensaku (1); Kisihi, Rieko (2); Wada, Hidenori (1)
1: Quality and Environmental Division, Panasonic Corporation, Osaka, Japan; 2: Innovation Institute of Future Design, Panasonic Corporation, Kyoto, Japan

Scholz, Ronja (1); Malila, Saija (3); Vihma, Markus (2); Marwede, Max (1); Cygert, Karolina (4)
1: Technical University of Berlin, Berlin, Germany; 2: Estonian Design Centre, Tallinn, Estonia; 3: Design Forum Finland, Helsinki, Finland; 4: Gdynia Design Centre / PPNT Gdynia, Sopot, Poland

Richter, Jessika Luth; Tojo, Naoko; Lindhqvist, Thomas
Lund University, International Institute for Industrial Environmental Economics, Lund, Sweden

Okrasinski, Thomas (1); Zhao, Fu (2); Lin, Xuda (2); Peterson, Alisha (3); Murphy, Padraig (4); Dender, Lisa (5); Kline. Jr., Donald (3); Helminen, Erkko (6); Schaffer, Mark (7)
1: Nokia Bell Labs, Richmond, USA; 2: Purdue University, West Lafayette, USA; 3: Intel, Phoenix, USA; 4: Logitech, Cork, Ireland; 5: IBM, Armonk, USA; 6: TTM, Guangzhou, China; 7: iNEMI, Morrisville, USA

Schiffleitner, Andreas (1); Prox, Martina (2); Wahl, Anne (3)
1: iPoint-Austria GmbH, Vienna, Austria; 2: IFU Hamburg GmbH, Hamburg, Germany; 3: iPoint-Systems GmbH, Fröndenberg/Ruhr, Germany

Aljarbou, Bessma
Apple, San Francisco, USA

Westphal, Ingo (1); Tietjen, Thorsten (2); Schuldt, Arne (3); Thoben, Klaus-Dieter (1,2)
1: BIBA, Bremen, Germany; 2: University of Bremen, BIK, Bremen, Germany; 3: Aimpulse Intelligent Systems GmbH, Bremen, Germany

Shinozuka, Machiko (1); Zhang, Xiaoxi (1); Tanaka, Yuriko (1); Kanamori, Yuko (2); Masui, Toshihiko (2)
1: Nippon Telegraph and Telephone Corporation, Tokyo, Japan; 2: National Institute for Environmental Studies, Ibaraki, Japan

Liu, Ran; Köhler, Andreas R.; Gensch, Carl-Otto
Öko-Institut, Berlin, Germany

Hara, Minako; Sakai, Nobuyuki
Nippon Telegraph and Telephone West Corporation, Osaka, Japan

Vaija, Mikko Samuli; Villanueva, Marcel
Orange, Rennes, France

Schöggl, Josef Peter (1); Schiffleitner, Andreas (2); Rusch, Magdalena (1); Baumgartner, Rupert (1)
1: University of Graz, Christian Doppler Laboratory for Sustainable Product Management enabling a Circular Economy, Graz, Austria; 2: iPoint-Austria GmbH, Vienna, Austria

Benecke, Stephan (1); Varga, Ofira (1); Legler, Solveig (2)
1: 1cc Corp., Washington D.C., USA; 2: 1cc Compliance Consulting GmbH, Holzgerlingen, Germany

Fritsch, Andreas (1); Beschke, Sebastian (2); Drucks, Tamara (3); Jekutsch, Sebastian (2)
1: Karlsruhe Instititute of Technology, Karlsruhe, Germany; 2: FairLötet e.V., Hamburg, Germany; 3: Vienna University of Technology, Vienna, Austria

Flipsen, Bas; Baker, Conny; de Pauw, Ingrid
Delft University of Technology, Delft, the Netherlands

De Fazio, Francesco (1); Arriola, Julieta Bolaños (2); Dangal, Sagar (2); Flipsen, Bas (2); Balkenende, Ruud (2)
1: Royal Philips, Amsterdam, The Netherlands; 2: Delft University of Technology, the Netherlands

Preut, Anna Luisa; Kopka, Jan-Philip
Fraunhofer IML, Dortmund, Germany

Furutani, Takashi; Takeuchi, Akira; tanaka, Yuriko
Nippon Telegraph and Telephone Corporation, Tokyo, Japan

Green, Aaron
Compliance & Risks, Ltd., Cork, Ireland

Jaeger-Erben, Melanie; Hipp, Tamina
Technical University of Berlin, Berlin, Germany

Mishima, Kuniko; Honda, Moe; Mishima, Nozomu
Akita University, Akita, Japan

Baron, Yifaat (1); Gensch, Carl-Otto (1); Moch, Katja (1); Deubzer, Otmar (2); Clemm, Christian (2); Köhler, Andreas (1); Löw, Clara (1)
1: Oeko-Institut e.V., Freiburg, Germany; 2: Fraunhofer IZM, Berlin, Germany

Battenberg, Christian; Beard, Adrian
Clariant Plastics & Coatings (Deutschland) GmbH, Frankfurt am Main, Germany

Steinbrecher, Angelika Maria (1); Hink-Lemke, Eva Susanne (1); Schiffleitner, Andreas (2)
1: iPoint-systems gmbh, Reutlingen, Germany; 2: iPoint-Austria GmbH, Vienna, Austria

Wegener, Alexander
opesus AG, Diedorf, Germany

Fruehbuss, Thomas
DXC Technology, Haan, Germany

Jager, Walter (1); Friedman, Robert (2); Kamigaki, Koshi (3); Blaszkowski, Solange (4)
1: ECD Compliance, Ottawa, Canada; 2: Siemens Healthineers, Malvern, USA; 3: JEMAI, Tokyo, Japan; 4: Philips International B.V., Eindhoven, The Netherlands

Blaszkowski, Solange (1); Théret, Jean-Pierre (2)
1: Philips International B.V., Eindhoven, Netherlands; 2: Dassault Systèmes, Lyon, France

Gilbert-Miller, Susan J
Green Electronics Council (GEC), Washington, USA

Deubzer, Otmar Karl (1); Wagner, Michelle (1); Art, Steven Art (2); Baron, Yifaat (3); Buchert, Matthias (3); Hilbert, Inga (3); Herreras, Lucia (4); Manoochehri, Shahrzad (5); Valdivia, Sonia (5); Wuisan, Lindsey (6); Zonneveld, Norbert (7)
1: UNU SCYCLE, Bonn, Germany; 2: Umicore, Antwerp, Belgium; 3: Öko-Institut, Darmstadt, Germany; 4: WEEE Forum, Brussels, Belgium; 5: World Resources Forum Association, St. Gallen, Switzerland; 6: ECOS, Ixelles, Belgium; 7: EERA, Amsterdam, The Netherlands

Baron, Yifaat (1); Maijala, Adeline (2); Lopez, Viviana (1); Thiebaud, Esther (6); Haarman, Arthur (6); Kaartinen, Harri (2); Herreras, Lucia (3); Hajosi, Enikö (3); Wuisan, Lindsey (5); Winkler, Josef (4); Gruen, Karl (4); Hilbert, Inga (1); Valdivia, Sonia (9); Manoochehri, Shahrzad (9); Deubzer, Otmar (7); Zonneveld, Norbert (8)
1: Oeko-Institut e.V., Freiburg, Germany; 2: SGS FIMKO OY, Espoo, Finland; 3: Waste Electrical and Electronical Equipment Forum AISBL, Brussels, Belgium; 4: Austrian Standards International, Vienna, Austria; 5: European Environmental Citizens Organization for Standardization, Brussels, Belgium; 6: Sofies EMAC, Zurich, Switzerland; 7: United Nations University, Tokyo, Japan; 8: European Electronics Recyclers Association, Arnhem, The Netherlands; 9: World Resources Forum Association, St. Gallen, Switzerland

Valdivia, Sonia (1); Buchert, Matthias (2); Hilbert, Inga (2); Zonneveld, Norbert (3); Yifaat, Baron (2); Manoochehri, Shahrzad (1); Wuisan, Lindsey (4); Herreras, Lucia (5); Winkler, Josef (6); Deubtzer, Otmar (7); Maijala, Adeline (8)
1: WRFA, St. Gallen, Switzerland; 2: Oeko-Institut, Darmstadt, Germany; 3: EERA, Amsterdam, The Netherlands; 4: ECOS, Ixelles, Belgium; 5: WEEE Forum, Brussels, Belgium; 6: Austrian Standards International, Vienna, Austria; 7: United Nations University, Tokyo, Japan; 8: SGS, Helsinki, Finland

Dietsche, Carsten (1); Herrmann, Ilona (2)
1: University of Hagen, Hagen, Germany; 2: DXC Technology Deutschland, Eschborn, Germany

Moriarty, Thomas; Ward, Allison
Dell, Dublin, Ireland

Polverini, Davide (1); Cordella, Mauro (2); Alfieri, Felice (2)
1: European Commission, DG GROW, Brussels, Belgium; 2: European Commission, Joint Research Centre, Seville, Spain

Siderius, Hans-Paul
Netherlands Enterprise Agency, Den Haag, The Netherlands

Graulich, Kathrin (1); Rüdenauer, Ina (1); Stamminger, Prof. Dr. Rainer (2); Krivosic, Juraj (3)
1: Oeko-Institut – Institute for Applied Ecology, Freiburg, Germany; 2: University of Bonn, Insitute for Household and Appliance Technology, Bonn, Germany; 3: SEVEn – The Energy Efficiency Center, Prague, Czech Republic

Campadello, Luca; Accili, Alessia; Legnani, Gaia
ECODOM – Consorzio Italiano Recupero e Riciclaggio Elettrodomestici, Lainate, Italy

Tosoratti, Paolo (1); Polverini, Davide (2); Scholand, Michael (3); Arregi, Andoni (4); Roig, Joan (4); Wucher, Thomas (4); Fernandes, Stephen (5)
1: European Commission, DG Energy, Brussels, Belgium; 2: European Commission, DG Internal Market, Industry, Entrepreneurship and SMEs, Brussels, Belgium; 3: CLASP Europe, Brussels, Belgium; 4: GTD GmbH, Markdorf, Germany; 5: Intertek, Buckinghamshire, UK

Rutta, Romina Alicia
University of Lausanne, Lausanne, Switzerland

McGovern, Damien John; Torregrosa, Luis
Compliance & Risks, Cork, Ireland